Patch Series

Subject generic/790: test post-EOF gap zeroing persistence
Author yi.zhang@huaweicloud.com
Date 2026-04-28 08:57:50 +0000 UTC
Version
Cc bfoster@redhat.com fstests@vger.kernel.org jack@suse.cz linux-ext4@vger.kernel.org linux-fsdevel@vger.kernel.org yangerkun@huawei.com yi.zhang@huawei.com yi.zhang@huaweicloud.com yizhang089@gmail.com zlang@kernel.org

Patches (1)

Name Content [All]
[PATCH v3] generic/790: test post-EOF gap zeroing persistence [Body]
Session 2026-04-28
ID (for dev) c7117983-93dc-4498-9398-02cb117024ac
Status finished
Triaged OK [Log]
Execution Log [Link]
Test Base Patched Verdict
[KASAN] Build Base 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] passed [Log]
[KASAN] Boot test: Base 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] passed [Log]
[KASAN] Build Patched 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] [patched] passed [Log]
[KASAN] Boot test: Patched 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] [patched] passed [Log]
[KASAN] Fuzz 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] 3b3bea6d4b9c162f9e555905d96b8c1da67ecd5b [Config] [patched] skipped [Log] [Artifacts]