Patch Series

Subject generic/790: test post-EOF gap zeroing persistence
Author yi.zhang@huaweicloud.com
Date 2026-04-24 09:22:28 +0000 UTC
Version
Cc bfoster@redhat.com fstests@vger.kernel.org jack@suse.cz linux-ext4@vger.kernel.org linux-fsdevel@vger.kernel.org yangerkun@huawei.com yi.zhang@huawei.com yi.zhang@huaweicloud.com yizhang089@gmail.com zlang@kernel.org

Patches (1)

Name Content [All]
[PATCH v2] generic/790: test post-EOF gap zeroing persistence [Body]
Session 2026-04-24
ID (for dev) 526944bb-e229-473d-923e-99f4ee933138
Status finished
Triaged OK [Log]
Execution Log [Link]
Test Base Patched Verdict
[KASAN] Build Base 45dcf5e28813954da4150e7260ccb61e95856176 [Config] passed [Log]
[KASAN] Boot test: Base 45dcf5e28813954da4150e7260ccb61e95856176 [Config] passed [Log]
[KASAN] Build Patched 45dcf5e28813954da4150e7260ccb61e95856176 [Config] [patched] passed [Log]
[KASAN] Boot test: Patched 45dcf5e28813954da4150e7260ccb61e95856176 [Config] [patched] passed [Log]
[KASAN] Fuzz 45dcf5e28813954da4150e7260ccb61e95856176 [Config] 45dcf5e28813954da4150e7260ccb61e95856176 [Config] [patched] skipped [Log] [Artifacts]